MIL-DTL-45204D
4.4.3.1.2 Separate specimens for embrittlement relief. Where separate specimens are to be
subjected to the embrittlement test described in 4.6.6, separate test specimens shall be prepared
of the same material, heat, and heat-treated to the same strength level and finish as the materials
of the articles they represent. The configuration shall be in accordance with figure 8 of ASTM
E8, for round specimens with the axis of the specimen perpendicular to the short transverse
direction. Specimens shall have 60 degree V-notch with the area at the base of the Vee
approximately equal to half the area of the full section of the specimen and 0.010 ± 0.0005 inch
radius of curvature at base of notch.
4.5 Visual examination. Each sample unit selected in accordance with 4.4.2 shall be visually
examined for compliance with the requirements for removal of plating salts (see 3.7.1),
workmanship (see 3.8), and identification marking (see 3.9). Unless otherwise specified in the
contract or purchase order (see 6.2), the samples shall be examined at four diameters
magnification.
4.6 Test methods.
4.6.1 Thickness measurements. Thickness of the plating and strikes shall be determined by any
method which will give results within ± 10 percent of the true thickness. With proper
equipment, procedures, and reference standards, thicknesses can be determined within
limitations as listed in Table VI (see 6.4).
TABLE VI. Thickness limitations.
Method
Thickness Limitation
Microscopic
100 microinches (0.0001 in.), minimum
Beta Backscatter Radiation
2000 microinches (0.002 in.), maximum
X-Ray Fluorescence
500 microinches (0.0005 in.), maximum
4.6.1.1 Microscopic test. Thickness shall be determined in accordance with ASTM B487 using
the modification shown in Table VII.
4.6.1.2 Beta-backscatter radiation. Thickness shall be determined in accordance with ASTM
B567 with back scatter radiation instruments consisting of a source of beta-radiation and a
detector, so arranged that the rays from the source are backscattered from the surface at which
the coating is being measured. The detector shall convert the backscatter rays to the thickness or
a number which is a function of the thickness.
4.6.1.3 X-Ray fluorescence. Thickness shall be determined in accordance with ASTM B568
with X-Ray fluorescence instruments consisting of an x-ray source, dispersing crystal and
detector so arranged that the x-rays generated within the sample are separated and measured.
The detector shall convert the x-rays to the thickness or a number which is a function of the
thickness.
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